The state-of-the-art Transmission Electron Microscopes examine the atomic structure of hard materials and soft-biological materials. The facility includes a cryo-TEM and three units for imaging and elemental composition determination.
The Keyence digital optical microscope system integrates advanced imaging, measurement (in the micrometer range), and recording functions. The range of magnification 20X - 1000X with 3-D imaging capabilities for determination of surface relief and defects. The captured images can be stored either as a PNG or a TIFF file. Location: McArthur Engineering Building, Room 141 The Zeiss EVO 60 is an environmental scanning electron microscope (EP-SEM) capable of operating in standard high vacuum (HV) operating mode and in extended pressure mode (EP). Location: McArthur Engineering Building, Room 141 The Field Emission-Scanning Electron Microscope is designed to capture high-resolution images down to nanoscale ranges. The Zeiss Ultra Plus combines the Gemini FE-SEM column with several detectors: the In-lens & Secondary electron (SE) Detector for high resolution images, the in-lens Energy selective Backscatter Detector (BSE) & Annular Backscatter Detector (AsB) for material contrast of many samples, and Energy Dispersive Spectroscopy (EDS) for elemental analysis. Location: McArthur Engineering Building, Room 141
Keyence VHX-5000
Digital Microscope (Optical)Zeiss EVO 60
Scanning Electron MicroscopeZeiss Ultra Plus FESEM
Scanning Electron Microscope
This compact, second generation high resolution tabletop Atomic Force Microscope (AFM) has all the important features and benefits expected from a light lever AFM. Sample Sizes: Up to 1" X 1" X 3/4" Standard Scanning Modes: Vibrating (Tapping), Non-Vibrating (Contact), Phase, LFM, F/D Scanners: 100 X 100 X 17 µm, 50 X 50 X17 µm, 15 X 15 X 7 µm Video Optical Microscope: Zoom to 400X, 2 µm resolution Stage and EBox Size: Compact table top design Location: McArthur Engineering Building, Room 141
TT-AFM
Atomic Force Microscope
The facility currently has the Zeiss Ultra Plus Field Emission Scanning Electron Microscope UM Engineering Faculty & Students UM Faculty and Students (non-Engineering) Outside UM Academia Corporate Sector and Non-Academia Zeiss SEM $ 50 / hr $ 60 / hr $ 75 / hr $ 100 / hr Additional charges for technician training and time may be incurred. To make a reservation and use the facility, please make a RESERVATION and click on the College of Engineering iLAB pages to proceed.